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Introduction to metrology management | Informador Tecnico
Introduction to metrology management
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Keywords

Metrology
Management
Quality
Metrology competence Metrología
Gestión
Calidad
Competencia metrológica

How to Cite

Cedeño Tamayo, O. (2011). Introduction to metrology management. Informador Tecnico, 75. https://doi.org/10.23850/22565035.19

Abstract

The new millennium brought challenges and paradigms for metrology. Scenarios like telecommunications, information technology, and computers have demonstrated that the speed of technological development hardware currently exceeded software. Modern computer machines have broadened their velocity and storage capacity, it is now common to speak of storage in terabytes. The field of scientific metrology is close to discovering the electronic mass standard based on Avogadro ́s number (6,025⋅10-24) or watt balance, which will broaden measurement accuracy. Soon, when we see a young womanwith a facial mole, it may be an ipod, given the high degree of nanoelectronic development. Recent review of International Basic and General terms in metrology - VIM, now ISO Guide 99:2008, shows a new metrology tendency, whichmust be understood by all the scientific, industrial, and legal community in an ever-more globalized world.
https://doi.org/10.23850/22565035.19
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References

BIPM – Bureau Internacional de Pesas y Medidas [Fecha de consulta: 2011-09-06]. Disponible en http://www.bipm.org/en/scientific/elec/watt_balance/.

CEDEÑO, Orlando; Gestión Metrológica, un enfoque por procesos, 2009. www.cmcmetrologia.com

CEDEÑO TAMAYO, Orlando "Un enfoque de procesos para la gestión metrológica" En: Colombia Espiral / Fundación Universitaria Agraria de Colombia Uniagraria ISSN: 0123-6628 Editorial v.014 fasc. p.17 - 20 ,2007.

Guía ISO/IEC 99:2008 Vocabulario Internacional de Términos y conceptos fundamentales en Metrología ISO 10012:2003 Gestión Metrológica.

ISO/IEC 17025:2005 Requisitos para evaluar la competencia de los laboratorios de Calibración o Ensayo.

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